发明名称 METHOD AND APPARATUS FOR IMAGING SAMPLE WITH SCANNING MICROSCOPY
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and an apparatus which image a sample with a scanning microscopy. <P>SOLUTION: Disclosed are a method and an apparatus for imaging a sample (28) with a scanning microscopy. Multiple sample points are scanned with a scanning beam (14) in consecutive scanning time sections. An intensity of light emitted from each of the scanned sample points is sensed repeatedly within each of the related scanning time sections. Based on intensities sensed at each of the scanned sample points, an intensity average value is found as an average value image point signal. Then, by synthesizing such average value image point signals, an average value raster image signal is generated. Further, in addition, based on intensities sensed at each of the scanned sample points, an intensity variance value is found as a variance image point signal. Then, by synthesizing such variance image point signals, a variance raster image signal is generated. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012145939(A) 申请公布日期 2012.08.02
申请号 JP20120001076 申请日期 2012.01.06
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 BIRK HOLGER;WIDZGOWSKI BERND;HOLGER NISSLE
分类号 G02B21/00;G01N21/64;G01N21/88 主分类号 G02B21/00
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