发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 A control circuit performs a write operation to 1-page memory cells along the selected word line, by applying a write pulse voltage to a selected word line, and then performs a verify read operation of confirming whether the data write is completed. When the data write is not completed, a step-up operation is performed of raising the write pulse voltage by a certain step-up voltage. A bit scan circuit determines whether the number of memory cells determined to reach a certain threshold voltage is equal to or more than a certain number among the memory cells read at the same time, according to read data held in the sense amplifier circuit as a result of the verify read operation. The control circuit changes the amount of the step-up voltage according to the determination of the bit scan circuit.
申请公布号 US2012198297(A1) 申请公布日期 2012.08.02
申请号 US201113237291 申请日期 2011.09.20
申请人 KAMIGAICHI TAKESHI;SAWAMURA KENJI;KABUSHIKI KAISHA TOSHIBA 发明人 KAMIGAICHI TAKESHI;SAWAMURA KENJI
分类号 G11C16/02;G06F11/07 主分类号 G11C16/02
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