发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique for obtaining an epitaxial film of good quality by reducing etching damage on a surface of a substrate when growing the epitaxial film. <P>SOLUTION: A manufacturing method of a semiconductor device comprises: a step of transferring a substrate having an insulator surface and a semiconductor surface on its surface into a processing chamber; an etching step of etching the semiconductor surface of the substrate by supplying hydrogen-containing gas and chlorine-containing gas to the substrate transferred into the processing chamber; a first purge step of purging residual chlorine on the surface of the substrate by supplying the hydrogen-containing gas to the etched substrate; and a film formation step of forming a silicon-containing film on the semiconductor surface of the substrate by supplying silicon-containing gas to the substrate from which the residual chlorine was purged. This manufacturing method continuously performs a step including the etching step and the first purge step twice or more. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012146741(A) |
申请公布日期 |
2012.08.02 |
申请号 |
JP20110002197 |
申请日期 |
2011.01.07 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
ISHIBASHI KIYOHISA;MORIYA ATSUSHI |
分类号 |
H01L21/205;C23C16/02;H01L21/302 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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