发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique for obtaining an epitaxial film of good quality by reducing etching damage on a surface of a substrate when growing the epitaxial film. <P>SOLUTION: A manufacturing method of a semiconductor device comprises: a step of transferring a substrate having an insulator surface and a semiconductor surface on its surface into a processing chamber; an etching step of etching the semiconductor surface of the substrate by supplying hydrogen-containing gas and chlorine-containing gas to the substrate transferred into the processing chamber; a first purge step of purging residual chlorine on the surface of the substrate by supplying the hydrogen-containing gas to the etched substrate; and a film formation step of forming a silicon-containing film on the semiconductor surface of the substrate by supplying silicon-containing gas to the substrate from which the residual chlorine was purged. This manufacturing method continuously performs a step including the etching step and the first purge step twice or more. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012146741(A) 申请公布日期 2012.08.02
申请号 JP20110002197 申请日期 2011.01.07
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 ISHIBASHI KIYOHISA;MORIYA ATSUSHI
分类号 H01L21/205;C23C16/02;H01L21/302 主分类号 H01L21/205
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