发明名称 RESIST COMPOSITION AND PRODUCTION METHOD OF RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To produce a resist pattern with excellent CD uniformity (CDU). <P>SOLUTION: The present invention presents a composition containing a resin (X) having a structural unit expressed by formulae (aa), (ab) and an acid generator (B). In the formulae, A<SP POS="POST">aa1</SP>represents a group such as an alkane-diyl group optionally having a substituent; R<SP POS="POST">aa2</SP>represents an aliphatic hydrocarbon group; and R<SP POS="POST">ab2</SP>represents an aromatic hydrocarbon group. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012145924(A) 申请公布日期 2012.08.02
申请号 JP20110267530 申请日期 2011.12.07
申请人 SUMITOMO CHEMICAL CO LTD 发明人 MASUYAMA TATSURO;YAMAMOTO SATOSHI;ICHIKAWA KOJI
分类号 G03F7/039;C08F220/18;G03F7/004 主分类号 G03F7/039
代理机构 代理人
主权项
地址