发明名称 METHOD FOR FORMING SEMICONDUCTOR STRUCTURE
摘要 <p>A method for forming a semiconductor structure comprises steps: forming a dummy gate (206) on a semiconductor substrate (202); forming source/drain areas (208) and a channel area (214) circling around the side wall (212) of the dummy gate (206); removing the dummy gate (206) to form a gate gap (222); forming a stress material layer (226) inside of the gate gap (222); annealing the semiconductor substrate (202); removing the stress material layer (226) inside of the gate gap (222); and forming a gate electrode (230) in the gate gap (222).</p>
申请公布号 WO2012100463(A1) 申请公布日期 2012.08.02
申请号 WO2011CN72961 申请日期 2011.04.18
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;YIN, HAIZHOU;LUO, ZHIJIONG 发明人 ZHU, HUILONG;YIN, HAIZHOU;LUO, ZHIJIONG
分类号 H01L21/8232 主分类号 H01L21/8232
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