| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of reducing an external load while ensuring excellent contact state between an external terminal and a conductive contact. <P>SOLUTION: A semiconductor testing device comprises: a plurality of conductive contacts 10 which are extensible and contractible in the direction of an external terminal 3 of a semiconductor device 2 and which can elastically contact with the external terminal 3; a nonconductive holding member 21 which holds the conductive contacts 10; and a guide plate 22 held by the holding member 21, which has a first through hole 22b allowing conductive contacts required for testing out of the conductive contacts to pass through and a second through hole 22a having a bore diameter smaller than that of the first through hole 22b and not allowing conductive contacts, which are not required for testing out of the conductive contacts, to pass through. <P>COPYRIGHT: (C)2012,JPO&INPIT |
