发明名称 |
SURFACE PLASMON SENSOR AND REFRACTIVE INDEX MEASUREMENT METHOD |
摘要 |
<p>The purpose of the present invention is to measure a refractive index with high accuracy and readily in a surface plasmon sensor for refractive index measurement purposes, without relying on the use of an absorption curve. The surface plasmon sensor is characterized by comprising a reflection board which comprises a metal layer having a periodic structure and has a sample placed thereon, a light source which can emit incident light to the reflection board, a light-receiving unit which can receive reflected light that is reflected on the reflection board, and a measurement unit which can measure a reflective index of the sample on the basis of information on the phases of two different waves that have different polarized directions and are contained in the reflected light from the surface of the periodic structure.</p> |
申请公布号 |
WO2012102350(A1) |
申请公布日期 |
2012.08.02 |
申请号 |
WO2012JP51707 |
申请日期 |
2012.01.26 |
申请人 |
INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY, JAPAN;MATSUDA TOYONORI;ODAGAWA HIROYUKI |
发明人 |
MATSUDA TOYONORI;ODAGAWA HIROYUKI |
分类号 |
G01N21/27;B82Y15/00;B82Y20/00;G01N21/21 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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