发明名称 TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DOMAIN DATA
摘要 A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.
申请公布号 US2012197598(A1) 申请公布日期 2012.08.02
申请号 US201113015084 申请日期 2011.01.27
申请人 DOBYNS KENNETH P.;ENGHOLM KATHRYN A.;BERGSIEKER AMY M.;HERRING STEVEN C.;WALDO GARY J.;TEKTRONIX, INC. 发明人 DOBYNS KENNETH P.;ENGHOLM KATHRYN A.;BERGSIEKER AMY M.;HERRING STEVEN C.;WALDO GARY J.
分类号 G06F19/00 主分类号 G06F19/00
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