发明名称 SYSTEM FOR ANALYZING BEHAVIOR OF IONS IN INSULATION FILM
摘要 A system for analyzing the behavior of ions in an insulation film is provided with a pulse voltage generator (402), a rolled element (403), an arithmetic device (405, 406), and a display device (407), and finds the ion density distribution within the insulation film by detecting, using the rolled element (403), ultrasonic waves generated within the insulation film by pulse voltage applied by the pulse voltage generator (402). The arithmetic device (405, 406) finds the ion density distributions within the insulation film at at least two different times from the detection result of the ultrasonic waves (105), and performs an advection-diffusion calculation on the basis of the ion density distributions at said at least two different times to find the ion density distribution within the insulation film at an arbitrarily defined time (107). The display device (407) displays the ion density distribution within the insulation film at the arbitrarily defined time (108).
申请公布号 WO2012102321(A1) 申请公布日期 2012.08.02
申请号 WO2012JP51602 申请日期 2012.01.26
申请人 HITACHI, LTD.;KOBAYASHI KINYA;KUSUKAWA JUNPEI 发明人 KOBAYASHI KINYA;KUSUKAWA JUNPEI
分类号 G01N29/00;G01N29/12 主分类号 G01N29/00
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