| 摘要 |
The invention relates to a laser system (20) for a microscope, comprising a laser module (22), a beam correction device (26), an optical fiber (31), a measuring element (34), and an external controller (37). The laser module (22) generates a light beam (24). The light beam (24) penetrates the beam correction device (26), which corrects a deviation of an actual value of at least one parameter of the light beam (24) from a target value of the parameter. The corrected light beam (24) is coupled into the optical fiber (31). The measuring element (34) is connected downstream of the optical fiber (31) and captures an actual value (36) of the intensity of at least one partial beam (32) of the corrected light beam (24). The external controller (37), regulates the actual value (36) of the intensity to a prescribed target value for the intensity. |
