发明名称 MARKER
摘要 <P>PROBLEM TO BE SOLVED: To provide a marker which can be accurately measured by an observing object even if the marker is slightly skewed to the observing object. <P>SOLUTION: The marker comprises a marker unit including a pattern and a lens which is put on the pattern and a gradation pattern thereof observed on the lens changes according to a direction of observation to the lens. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012145559(A) 申请公布日期 2012.08.02
申请号 JP20110155630 申请日期 2011.07.14
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 TANAKA HIDEYUKI;SUMI YASUSHI;MATSUMOTO YOSHIHISA
分类号 G01B11/00;G01B11/26 主分类号 G01B11/00
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