发明名称 |
LATERAL DOUBLE DIFFUSED METAL OXIDE SEMICONDUCTOR AND METHOD FOR FABRICATING THE SAME |
摘要 |
<p>PURPOSE: A lateral double-diffused metal-oxide semiconductor (LDMOS) and a manufacturing method thereof are provided to prevent insertion of electrons or holes into a semiconductor substrate generated when voltage is applied to a drain. CONSTITUTION: A second conductivity type buried layer(302) is formed inside a first conductivity type epitaxial layer(300). A high voltage second conductivity type well(304) is formed on an upper portion in one region of the second conductivity type buried layer. A first conductivity type drain extension region(308) is formed on the upper portion of another region of the second conductivity type buried layer. A second conductivity type drain extension region(310) is formed inside a partial region of the first conductivity type drain extension region. The second conductivity type drain extension region includes a gate pattern and a drain region.</p> |
申请公布号 |
KR20120085550(A) |
申请公布日期 |
2012.08.01 |
申请号 |
KR20110006948 |
申请日期 |
2011.01.24 |
申请人 |
DONGBU HITEK CO., LTD. |
发明人 |
CHO, CHEOL HO;KO, CHOUL JOO |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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