发明名称 Memory architecture and cell design employing two access transistors
摘要 An improved memory array architecture and cell design in which the cell employs two access transistors. In one embodiment, the two access transistors in each cell are coupled at one of their channel terminals to a memory element, which in turn is connected to a bit line. The other of the channel terminals are effectively tied together via reference lines. The word lines (i.e., gates) of the two access transistors are also tied together. The result in a preferred embodiment is a cell having two access transistors wired and accessed in parallel. With such a configuration, the widths of the access transistors can be made one-half the width of more-traditional one-access-transistor designs, saving layout space in that (first) dimension. Moreover, because the word lines of adjacent cells will be deselected, the improved design does not require cell-to-cell isolation (e.g., trench isolation) in the other (second) dimension. The result, when applied to a phase change memory, comprises about a 37% reduction in layout area from previous cell designs.
申请公布号 US8233316(B2) 申请公布日期 2012.07.31
申请号 US20090561896 申请日期 2009.09.17
申请人 LIU JUN;MICRON TECHNOLOGY, INC. 发明人 LIU JUN
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
主权项
地址