| 摘要 |
An analyzing apparatus includes a first optical unit that causes a terahertz wave generated by a generation unit to be condensed at a first position in an object; a second optical unit that causes the terahertz wave from the object to be condensed at a second position; a third optical unit that causes the terahertz wave condensed at the second position to be condensed at a third position; and a detection unit that detects the terahertz wave condensed at the third position. The analyzing apparatus selectively detects the terahertz wave from the first position in the object from among terahertz waves from the object. |
