发明名称 |
Method for error test, recordation and repair |
摘要 |
In a memory device, an on-die register is provided that is configured to store a row address as well as a column address of a memory cell that fails a test. Storing the row address frees testing from being limited to activating at one time only rows related to a common redundant segment. Storing the row address also guides repair using segmented redundancy. As an addition or alternative, information may be stored in an anti-fuse bank that is designed to provide access to a redundant cell but has not yet enabled access to that cell. If the information stored in the anti-fuse bank relates to the failure of the redundant cell, such information may be used to avoid repairing with that redundant cell. |
申请公布号 |
US8234527(B2) |
申请公布日期 |
2012.07.31 |
申请号 |
US201113098569 |
申请日期 |
2011.05.02 |
申请人 |
MOHR CHRISTIAN N.;COWLES TIMOTHY B.;MICRON TECHNOLOGY, INC. |
发明人 |
MOHR CHRISTIAN N.;COWLES TIMOTHY B. |
分类号 |
G11C29/00;G06F17/50;G11C7/00;G11C17/18;G11C29/24;G11C29/44 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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