发明名称 PHOTOLITHOGRAPHIC LED FABRICATION USING PHASE-SHIFT MASK
摘要 <p>Photolithographic methods of forming a roughened surface for an LED to improve LED light emission efficiency are disclosed. The photolithographic methods include photolithographically imaging a phase-shift mask pattern onto a photoresist layer of a substrate to form therein a periodic array of photoresist features. The roughened substrate surface is created by processing the exposed photoresist layer to form a periodic array of substrate posts in the substrate surface. A p-n junction multilayer structure is then formed atop the roughened substrate surface to form the LED. The periodic array of substrate posts serve as scatter sites that improve the LED light emission efficiency as compared to the LED having no roughened substrate surface. The use of the phase-shift mask enables the use of affordable photolithographic imaging at a depth of focus suitable for non-flat LED substrates while also providing the needed resolution to form the substrate posts.(Figure 8A)</p>
申请公布号 SG182050(A1) 申请公布日期 2012.07.30
申请号 SG20110085123 申请日期 2011.11.17
申请人 ULTRATECH, INC. 发明人 HAWRYLUK, ANDREW M.;HSIEH, ROBERT L.;FLACK, WARREN W.
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