发明名称 Double diffused metal oxide semiconductor device and manufacturing method thereof
摘要 The present invention discloses a double diffused metal oxide semiconductor (DMOS) device and a manufacturing method thereof. The DMOS device includes: an isolation structure for defining device regions; a gate with a ring-shaped structure; a drain located outside the ring; and a lightly doped drain, a source, and a body electrode located inside the ring. To increase the sub-threshold voltage at the corners of the gate, the corners are located completely on the isolation structure, or the lightly doped drain is apart from the corners by a predetermined distance.
申请公布号 US2012187483(A1) 申请公布日期 2012.07.26
申请号 US201113066622 申请日期 2011.04.20
申请人 YANG CHING-YAO;HUANG TSUNG-YI;CHU HUAN-PING;SU HUNG-DER;RICHTEK TECHNOLOGY CORPORATION, R.O.C. 发明人 YANG CHING-YAO;HUANG TSUNG-YI;CHU HUAN-PING;SU HUNG-DER
分类号 H01L29/78;H01L21/336;H01L21/8232 主分类号 H01L29/78
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