发明名称 BUFFERED SUBSTRATE FOR SEMICONDUCTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a technology for achieving miniaturization and uniformity of a polycrystal silicon particle diameter without increasing manufacturing time and manufacturing cost. <P>SOLUTION: A buffered substrate for a semiconductor is used for a substrate and the like in which a polycrystal silicon layer 108 is obtained by crystallization of a silicon layer 108 formed on a substrate 100 by irradiation of laser beams 106, and a buffer layer 102 is formed between the substrate 100 and the silicon layer 104. In such a buffered substrate having the buffer layer 102, the buffer layer 102 has a melting point higher than a limit temperature of the substrate 100, and further, in crystallization of the silicon layer 104, defines nuclear density of the silicon layer for forming uniform silicon crystal particles on the buffer layer 102, and still further, functions as a basis for isotropic grain growth. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012142594(A) 申请公布日期 2012.07.26
申请号 JP20120057317 申请日期 2012.03.14
申请人 THOMSON LICENSING 发明人 FORK DAVID K;BOYCE JAMES B;MEI PING;READY STEVE;JOHNSON RICHARD I;ANDERSON GREG B
分类号 H01L21/20;H01L21/02;H01L21/205;H01L21/336;H01L27/12;H01L29/786 主分类号 H01L21/20
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