发明名称 |
ETALON FILTER, FREQUENCY CALIBRATION SYSTEM USING ETALON FILTER, AND FREQUENCY CALIBRATION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an etalon filter capable of accurately calibrating the frequency of a terahertz wave, frequency calibration system, and frequency calibration method. <P>SOLUTION: The etalon filter is provided with a gap between two substrates having transmissivity in light and terahertz bands such as diamond substrates by joining a spacer to the two substrates. Light from a light source is transmitted through the etalon filter to measure free spectrum intervals of the light, and the etalon filter is irradiated with the terahertz wave to measure free spectrum intervals of the terahertz wave. The free spectrum intervals when the light is transmitted are compared with the free spectrum intervals when the terahertz wave is transmitted to control the frequency of the terahertz wave. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012141473(A) |
申请公布日期 |
2012.07.26 |
申请号 |
JP20110000073 |
申请日期 |
2011.01.04 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
KINOSHITA MOTOI;IIDA HITOSHI;SHIMADA YOZO |
分类号 |
G02B5/28;G02B26/00 |
主分类号 |
G02B5/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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