发明名称 |
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
The present application provides a semiconductor structure and a method for manufacturing the same. The semiconductor structure comprises a semiconductor substrate, a semiconductor fin located on the semiconductor substrate, and an etch stop layer located between the semiconductor substrate and the semiconductor fin, wherein a lateral sidewall of the semiconductor fin is substantially on the Si {111} crystal plane. Since the semiconductor fin exhibits better surface quality and less crystal defects, it is favorable for manufacturing FINFET.
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申请公布号 |
US2012187418(A1) |
申请公布日期 |
2012.07.26 |
申请号 |
US201113380964 |
申请日期 |
2011.03.04 |
申请人 |
YIN HAIZHOU;LUO ZHIJIONG;ZHU HUILONG |
发明人 |
YIN HAIZHOU;LUO ZHIJIONG;ZHU HUILONG |
分类号 |
H01L29/04;H01L21/20;H01L29/20;H01L29/24;H01L29/36 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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