发明名称 SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 The present application provides a semiconductor structure and a method for manufacturing the same. The semiconductor structure comprises a semiconductor substrate, a semiconductor fin located on the semiconductor substrate, and an etch stop layer located between the semiconductor substrate and the semiconductor fin, wherein a lateral sidewall of the semiconductor fin is substantially on the Si {111} crystal plane. Since the semiconductor fin exhibits better surface quality and less crystal defects, it is favorable for manufacturing FINFET.
申请公布号 US2012187418(A1) 申请公布日期 2012.07.26
申请号 US201113380964 申请日期 2011.03.04
申请人 YIN HAIZHOU;LUO ZHIJIONG;ZHU HUILONG 发明人 YIN HAIZHOU;LUO ZHIJIONG;ZHU HUILONG
分类号 H01L29/04;H01L21/20;H01L29/20;H01L29/24;H01L29/36 主分类号 H01L29/04
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