发明名称 |
SiC EPITAXIAL WAFER AND MANUFACTURING METHOD THEREFOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a step bunching-free SiC epitaxial wafer and manufacturing method therefor, capable of achieving no step bunching over the whole surface of a wafer. <P>SOLUTION: The present invention is a SiC epitaxial wafer formed with a SiC epitaxial layer on a 4H-SiC monocrystalline substrate inclined at an off angle of 0.4° to 5°. The SiC epitaxial wafer has no short step bunching. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012142597(A) |
申请公布日期 |
2012.07.26 |
申请号 |
JP20120062627 |
申请日期 |
2012.03.19 |
申请人 |
SHOWA DENKO KK |
发明人 |
MOMOSE KENJI;TAJIMA YUTAKA;SAKAGUCHI YASUYUKI;ODAWARA MICHIYA;MIYASAKA YOSHIHIKO |
分类号 |
H01L21/205;C01B31/36;C23C16/42 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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