发明名称 |
SEMICONDUCTOR DEVICE EVALUATION APPARATUS AND SEMICONDUCTOR DEVICE EVALUATION METHOD |
摘要 |
A semiconductor device evaluation apparatus includes a current measurement portion that measures a current value at multiple times included in a period from the beginning of application of a voltage to a semiconductor device to a steady state of the current value flowing through the semiconductor device; a period division portion that divides the period into a first period and a second period later than the first period and finds a curve approximately representing a temporal change in a current value measured at time included in the second period so that a difference between a current value measured at the time included in the first period and a current value found by extrapolating the curve at the same time becomes greater than a specified threshold value; and a current estimation portion that estimates a current value flowing through the semiconductor device at the start time.
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申请公布号 |
US2012187975(A1) |
申请公布日期 |
2012.07.26 |
申请号 |
US201213351851 |
申请日期 |
2012.01.17 |
申请人 |
KOH RISHO;IIZUKA TAKAHIRO;RENESAS ELECTRONICS CORPORATION |
发明人 |
KOH RISHO;IIZUKA TAKAHIRO |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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