发明名称 Microscope System, Surface State Observing Method, And Surface State Observing Program
摘要 To provide a microscope system enabling the user to accurately observe the surface of the observing target in a short time. A sensitivity parameter for adjusting a value of the pixel data corresponding to a plurality of pixels is set. The pixel data is acquired with a first sensitivity value set as the sensitivity parameter, and the number of pixels in which the peak value of the pixel data is smaller than or equal to a threshold value is detected. A ratio of the detected number of pixels with respect to the total number of pixels region is calculated, where the pixel data is acquired by a second sensitivity value different from the first sensitivity value when the ratio is greater than or equal to a reference value, and the pixel data is not acquired by the second sensitivity value when the ratio is smaller than the reference value.
申请公布号 US2012188360(A1) 申请公布日期 2012.07.26
申请号 US201213346304 申请日期 2012.01.09
申请人 OKAMOTO YOICHI;KARUBE TAKUYA;KEYENCE CORPORATION 发明人 OKAMOTO YOICHI;KARUBE TAKUYA
分类号 H04N7/18 主分类号 H04N7/18
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