发明名称 |
Microscope System, Surface State Observing Method, And Surface State Observing Program |
摘要 |
To provide a microscope system enabling the user to accurately observe the surface of the observing target in a short time. A sensitivity parameter for adjusting a value of the pixel data corresponding to a plurality of pixels is set. The pixel data is acquired with a first sensitivity value set as the sensitivity parameter, and the number of pixels in which the peak value of the pixel data is smaller than or equal to a threshold value is detected. A ratio of the detected number of pixels with respect to the total number of pixels region is calculated, where the pixel data is acquired by a second sensitivity value different from the first sensitivity value when the ratio is greater than or equal to a reference value, and the pixel data is not acquired by the second sensitivity value when the ratio is smaller than the reference value. |
申请公布号 |
US2012188360(A1) |
申请公布日期 |
2012.07.26 |
申请号 |
US201213346304 |
申请日期 |
2012.01.09 |
申请人 |
OKAMOTO YOICHI;KARUBE TAKUYA;KEYENCE CORPORATION |
发明人 |
OKAMOTO YOICHI;KARUBE TAKUYA |
分类号 |
H04N7/18 |
主分类号 |
H04N7/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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