发明名称 APPARATUS FOR MEASURING LATERAL DISPLACEMENT OF BUILDING AND APPARATUS FOR COMPUTING COMPENSATOIN VALUE AGAINST LATERAL DISPLACEMENT OF BUILDING
摘要 PURPOSE: A device for transversal strain of a structure and a device for computing a correction value according to the transversal strain of the structure are provided to measure a strain of a top layer area with a GPS device and the strain of the rest area with a laser scanner, thereby accurately measuring a transversal displacement of a whole building structure. CONSTITUTION: A device for transversal strain of a structure comprises a reference value measurement unit(110), a relative storey displacement measuring unit(120), and a displacement calculating unit(130). The reference value measurement unit measures a 3D absolute displacement value of a top layer area by being arranged in the top layer of a structure. The relative storey displacement measuring unit measures relative storey displacement value of the exterior of the structure except for the top layer area of the structure. The displacement calculating unit calculates a vertical displacement value of the whole structure by summing up the absolute displacement value measured by the reference value measurement unit and the relative storey displacement value measured by the relative storey displacement measuring unit.
申请公布号 KR20120083694(A) 申请公布日期 2012.07.26
申请号 KR20110004978 申请日期 2011.01.18
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 PARK, HYO SEON;KIM, BUB RYUR
分类号 G01B21/32;G01B11/16;G01S19/00 主分类号 G01B21/32
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