发明名称 Substrate for use in measuring electric characteristics
摘要 <p>A substrate (1) for use in measuring electric characteristics includes a plurality of dielectric layers laminated therein, front-surface coplanar lines (14A-D) disposed at a front surface of the substrate, back-surface coplanar electrodes (24A-D) disposed at a back surface thereof, and interlayer earth electrodes (3A,3B) disposed between dielectric layers. First ends of the front-surface coplanar lines (14A-D) form a front-surface component mounting electrode (12), and first ends of the back-surface coplanar lines (24A-D) form a back-surface component mounting electrode (22). The front-surface component mounting electrode (12) and the back-surface component mounting electrode (22) exhibit substantially the same pattern when viewed from the direction of the normal to the front surface. Each of the front-surface component mounting electrode (12) and the back-surface component mounting electrode (22) has an electrode pattern asymmetric about a substantially central line of the front surface or about that of the back surface. </p>
申请公布号 EP2320239(A3) 申请公布日期 2012.07.25
申请号 EP20100188204 申请日期 2010.10.20
申请人 MURATA MANUFACTURING CO., LTD. 发明人 YONEKURA, HIROSHI
分类号 G01R1/04;G01R31/28 主分类号 G01R1/04
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