| 摘要 |
PURPOSE: A probe is provided to reduce contact resistance by forming a plurality of contact points. CONSTITUTION: An upper plunger(110) is contactable with an electrode pad or a solder ball of a semiconductor device(S) and movable up and down. A lower plunger(120) is contactable with a printed circuit board(T) of a tester and movable up and down. An elastic member(130) elastically biases the upper plunger and the lower plunger to be separated from each other. An electrical connection part(140) electrically connects the upper plunger and the lower plunger even though upper plunger and the lower plunger are shaken up and down. |
