发明名称 JTAG controlled self-repair after packaging
摘要 An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The JTAG controlled self-repair system allows a user to direct circuitry to blow fuses using an externally supplied voltage to electrically couple or isolate components to permanently repair a memory location with JTAG standard TMS and TCK signals. The system may optionally sequentially repair more than one memory location using a repair sequencer.
申请公布号 US8230274(B2) 申请公布日期 2012.07.24
申请号 US201213358442 申请日期 2012.01.25
申请人 FUJIWARA YOSHINORI;NOMURA MASAYOSHI;MICRON TECHNOLOGY, INC. 发明人 FUJIWARA YOSHINORI;NOMURA MASAYOSHI
分类号 G11C29/00;G01R31/28;G11C17/18 主分类号 G11C29/00
代理机构 代理人
主权项
地址