| 摘要 |
A system for measuring deflection in a structure. The novel system includes a detector array for measuring a position of a spot of light and a light source configured to form a spot of light at a position that is dependent on a deflection in the structure. In an illustrative embodiment, the system includes a corner reflector adapted to reflect a beam of light from the light source to the detector array such that a vertical position of the reflected beam is dependent on a total bending in the structure. In an alternate embodiment, the system includes a mirror for reflecting a beam of light from the light source to the detector array such that a vertical position of the reflected beam at the detector array is dependent on a deflection angle between two adjacent panels in the structure. |
