发明名称 MASK BLANK, METHOD FOR MANUFACTURING MASK BLANK AND PHOTOMASK
摘要 <p>PURPOSE: A mask blank and a method for manufacturing the same are provided to reduce costs and efforts required for replacing an optical filter by filtering exposing light of specific wavelengths using a filtering film. CONSTITUTION: A mask blank includes a filtering film(12) on a substrate(11). The transmittance of the filtering film to exposing light of 313nm or less is lower than or equal to 40%. The filtering film includes one or more metals. The thickness of the filtering film is more than or equal to 30nm. The transmittance of the filtering film to i-line, h-line, and g-line is more than or equal to 60%. The filtering film further includes one or more of oxygen, nitrogen, carbon, hydrogen, and fluorine. The metals are one or more of Cr, Ti, Mo, Si, Ta, Hf, Ni, Zr, W, Co, V, Pd, Nb, Zn, Ge, Al, Pt, Mn, and Fe.</p>
申请公布号 KR20120081668(A) 申请公布日期 2012.07.20
申请号 KR20110001929 申请日期 2011.01.07
申请人 S&STECH CO., LTD. 发明人 NAM, KEE SOO;KANG, GEUNG WON;YANG, CHUL KYU;KWON, SOON GI
分类号 G03F1/38;H01L21/027 主分类号 G03F1/38
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