发明名称 PHOTOMASK INCLUDING SUPER LENS AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: A photo-mask and a manufacturing method thereof are provided to form a micro-pattern having high resolution by enhancing resolution of a stepper in the photo lithography process and to improve performance of a far-field super lens. CONSTITUTION: A substrate comprises an intaglio pattern(5). The mask pattern layer(20) is located within the intaglio pattern. A super lens is located on the substrate and the mask pattern layer. The super lens comprises a first negative refraction index layer(40) having a negative refraction index. A first dielectric layer(30) is located between the super lens and the substrate. A second dielectric layer(50) is located on the upper side of the super lens. A first sub pattern layer is located at one side either the upper side or the lower side of the first negative refraction index layer.</p>
申请公布号 KR20120081658(A) 申请公布日期 2012.07.20
申请号 KR20100129284 申请日期 2010.12.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG KWANG;JU, JIN HO;KANG, MIN;KONG, HYANG SHIK
分类号 H01L21/027;G03F1/38 主分类号 H01L21/027
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