发明名称 METHOD TO CONTROL METAL SEMICONDUCTOR MICRO-STRUCTURE
摘要 A method of forming a metal semiconductor alloy that includes forming an intermixed metal semiconductor region to a first depth of a semiconductor substrate without thermal diffusion. The intermixed metal semiconductor region is annealed to form a textured metal semiconductor alloy. A second metal layer is formed on the textured metal semiconductor alloy. The second metal layer on the textured metal semiconductor alloy is then annealed to form a metal semiconductor alloy contact, in which metal elements from the second metal layer are diffused through the textured metal semiconductor alloy to provide a templated metal semiconductor alloy. The templated metal semiconductor alloy includes a grain size that is greater than 2× for the metal semiconductor alloy, which has a thickness ranging from 15 nm to 50 nm.
申请公布号 US2012181697(A1) 申请公布日期 2012.07.19
申请号 US201113006664 申请日期 2011.01.14
申请人 LAVOIE CHRISTIAN;OZCAN AHMET S.;ZHANG ZHEN;YANG BIN;GLOBALFOUNDRIES INC.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LAVOIE CHRISTIAN;OZCAN AHMET S.;ZHANG ZHEN;YANG BIN
分类号 H01L23/532;H01L21/768 主分类号 H01L23/532
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