发明名称 PROCESSING STATE MONITORING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a processing state monitoring device assisting an abnormality diagnosis of an object to be monitored in being quickly performed. <P>SOLUTION: A processing state change monitoring device displaying an abnormality diagnosis main screen 40 comprises: trigger information displays 44 and 45 displaying data for diagnoses; a criterion setting section 42 setting criteria TH1 and TH2 for detecting state changes on the trigger information displays 44 and 45; a factor candidate variable display 43 enumerating variable names of factor candidate variables becoming factors of processing state changes and abnormalities in a case where the processing state changes and the abnormalities are detected by means of the data for diagnoses of the trigger information displays 44 and 45 and the criteria TH1 and TH2 of the criterion setting section 42; a trend graph display link section 48 receiving instructions to display trend graphs of the factor candidate variables displayed on the factor candidate variable display 43; and a factor candidate variable trend display 48A displaying trend graphs of state change factor candidate variables in a case where the instructions are input to the trend graph display link section 48. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012138044(A) 申请公布日期 2012.07.19
申请号 JP20100291645 申请日期 2010.12.28
申请人 TOSHIBA CORP;JAPAN SEWAGE WORKS AGENCY 发明人 YAMANAKA OSAMU;HIRAOKA YUKIO;NAGAIWA AKIHIRO;YAMAMOTO KATSUYA;SANO KATSUMI;SASAKI MINORU;HASHIMOTO TOSHIICHI
分类号 G05B23/02 主分类号 G05B23/02
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