发明名称 SCANNING ELECTRON MICROSCOPE
摘要 <p>Provided is an electron microscope wherein a conventionally available evacuation assembly is used, such as a turbo-molecular pump, an ion pump, or a rotary pump, implementing a device with which it is possible to safely execute observation or adsorption of a high-rarity object. A safe SEM which has a low risk of electrical discharge is implemented by comprising: a probe; a means for replacing the interior of a specimen chamber with a prescribed gas; and a means for imaging by ion current detection or absorbed current detection. Additionally, a means is disposed for controlling the polarity of the voltage which is imparted to the probe. Furthermore, a control means is disposed for controlling the imparted voltage value to the probe according to the degree of vacuum within the specimen chamber.</p>
申请公布号 WO2012095911(A1) 申请公布日期 2012.07.19
申请号 WO2011JP06130 申请日期 2011.11.02
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION;HATANO, HARUHIKO;SUZUKI, HIROYUKI;NAKAYAMA, YOSHIHIKO 发明人 HATANO, HARUHIKO;SUZUKI, HIROYUKI;NAKAYAMA, YOSHIHIKO
分类号 H01J37/20;H01J37/18;H01J37/28 主分类号 H01J37/20
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