发明名称 |
SCANNING ELECTRON MICROSCOPE |
摘要 |
<p>Provided is an electron microscope wherein a conventionally available evacuation assembly is used, such as a turbo-molecular pump, an ion pump, or a rotary pump, implementing a device with which it is possible to safely execute observation or adsorption of a high-rarity object. A safe SEM which has a low risk of electrical discharge is implemented by comprising: a probe; a means for replacing the interior of a specimen chamber with a prescribed gas; and a means for imaging by ion current detection or absorbed current detection. Additionally, a means is disposed for controlling the polarity of the voltage which is imparted to the probe. Furthermore, a control means is disposed for controlling the imparted voltage value to the probe according to the degree of vacuum within the specimen chamber.</p> |
申请公布号 |
WO2012095911(A1) |
申请公布日期 |
2012.07.19 |
申请号 |
WO2011JP06130 |
申请日期 |
2011.11.02 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION;HATANO, HARUHIKO;SUZUKI, HIROYUKI;NAKAYAMA, YOSHIHIKO |
发明人 |
HATANO, HARUHIKO;SUZUKI, HIROYUKI;NAKAYAMA, YOSHIHIKO |
分类号 |
H01J37/20;H01J37/18;H01J37/28 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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