发明名称 SAMPLE STAGE DEVICE, AND ELECTRON BEAM DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To move a specimen to a desired position in a desired attitude by a simple and intuitive operation. <P>SOLUTION: When a multi-axial stage 40 of a scanning electron microscope 10 is rotated horizontally, inclined or moved horizontally, an operation of rotating, inclining or horizontally moving an image for specification is performed by means of a mouse 62 while creating an image for specification from an SEM image obtained from a signal of a secondary electron detector 20 and displaying the image on an image display unit 61. A coordinate generation means 52 converts the current coordinates of the multi-axial stage 40 based on the image for specification after operation, and multi-axial stage drive control means 53 drives the multi-axial stage 40 by the converted coordinates. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012138219(A) 申请公布日期 2012.07.19
申请号 JP20100288868 申请日期 2010.12.24
申请人 TOPCON CORP 发明人 UENO KUSUO;KOSHIKAWA HIROYUKI
分类号 H01J37/20;H01J37/22;H01J37/24 主分类号 H01J37/20
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