| 摘要 |
<P>PROBLEM TO BE SOLVED: To accurately detect a touch position by detecting a warp in a substrate. <P>SOLUTION: A detected X coordinate value at a previous cycle is compared with that at a present cycle to determine a direction of movement of a touch position. When the touch position moves in such a direction that a value in an X-axis direction becomes larger (step S14: Yes) and the movement amount of the touch position is larger than a predetermined value (step S15: No), a position corrected in such a direction that the value in the X-axis direction becomes larger than an average value of the detected X coordinate values is specified as the touch position (step S19). When the touch position moves in such a direction that the value in the X-axis direction becomes smaller (step S21: Yes) and the movement amount of the touch position is larger than the predetermined value (step S22: No), a position corrected in such a direction that the value in the X-axis direction becomes smaller than the average value of the detected X coordinate values is specified as the touch position (step S25). In other cases, the average value of the detected X coordinate values is specified as the touch position. <P>COPYRIGHT: (C)2012,JPO&INPIT |
