发明名称 FORMATION METHOD OF OPENING AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for forming an opening in an insulation film on a conductive layer so as to expose the conductive layer located at a lower part of a laminated structure without at least increasing the number of photo masks. <P>SOLUTION: A part of a lower conductive layer in a laminated structure, where an opening is provided, is exposed in advance with an etching mask formed by using a photo mask which is the same as a photo mask used for forming the opening. Then, a protective insulation film is formed, and an opening is formed in the protective insulation film so that an upper conductive layer in the laminated structure is not exposed at the opening. The formation method of the opening may be applied to a manufacturing method of a semiconductor device. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012138413(A) 申请公布日期 2012.07.19
申请号 JP20100288373 申请日期 2010.12.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 FURUKAWA SHINOBU;MORIKUBO MIYAKO;MIZOGUCHI TAKAFUMI
分类号 H01L23/522;H01L21/336;H01L21/768;H01L29/786 主分类号 H01L23/522
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