发明名称 GAS SAMPLING DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To suppress thickness reduction of a probe pipe due to erosion by dust contained in a gas or corrosion by a corrosive gas. <P>SOLUTION: A gas sampling device is configured such that the cross section of the end portion R<SB POS="POST">1</SB>is formed in a wedge shape at the end portion 14 of a probe pipe 12 disposed during gas flowing to dispose a tip opening 24a at the wedge-shaped tip, the tip opening is disposed so as to face to a gas flow and a coating layer having wear resistance and corrosion resistance is formed on the surface of the base material of the probe pipe 12 in the end area R<SB POS="POST">2</SB>of the probe pipe 12 including the end portion R<SB POS="POST">1</SB>. The gas flow is formed into a flow along an inclined plane forming a wedge shape, thereby preventing corrosion by a corrosive gas and abrasion by dust. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012137437(A) 申请公布日期 2012.07.19
申请号 JP20100291360 申请日期 2010.12.27
申请人 MITSUBISHI HEAVY IND LTD 发明人 SHIRANE TAKAHIRO;TANAKA YASUHIRO;KOYAMA TOMONORI
分类号 G01N1/22 主分类号 G01N1/22
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