发明名称 METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS
摘要 Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from (lie target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
申请公布号 US2012183125(A1) 申请公布日期 2012.07.19
申请号 US201113275909 申请日期 2011.10.18
申请人 LEDOUX ROBERT J.;BERTOZZI WILLIAM;PASSPORT SYSTEMS, INC. 发明人 LEDOUX ROBERT J.;BERTOZZI WILLIAM
分类号 G01N23/201 主分类号 G01N23/201
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