发明名称 |
IMPROVED METHOD FOR MAKING PATTERN FROM SIDEWALL IMAGE TRANSFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an easy-to-implement method for producing a pattern partially defined by sidewall image transfer. <P>SOLUTION: A substrate 1 is provided with a layer of first material 2, a first etching mask 4, a covering layer 3 and a second etching mask. The covering layer 3 has a covered main area and an uncovered secondary area. The secondary area of the covering layer 3 is partially etched via the second etching mask to form a salient pattern. Lateral spacers are formed around the salient pattern defining a third etching mask. The second etching mask is eliminated. The covering layer 3 is etched by means of the third etching mask to form a salient pattern in the covering layer 3 and to uncover the first etching mask 4 and the first material 2. The layer of first material 2 is etched to form a pattern made from the first material 2. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012138570(A) |
申请公布日期 |
2012.07.19 |
申请号 |
JP20110260794 |
申请日期 |
2011.11.29 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES |
发明人 |
SEBASTIEN BARNOLA;JEROME BELLEDENT |
分类号 |
H01L21/3065;H01L21/3213;H01L21/768 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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