发明名称 PROBE FOR PHOTOACOUSTIC INSPECTION AND PHOTOACOUSTIC INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To detect a photoacoustic wave higher in S/N in a photoacoustic inspection using a photoacoustic effect. <P>SOLUTION: A probe 70 used for a photoacoustic inspection includes a photoirradiation part 15 for irradiating a subject 7 with light L and an electroacoustic transformation part 3 for transforming the photoacoustic wave U into an electric signal. The photoirradiation part 15 irradiates an irradiation range on the subject 7 which encompasses all corresponding areas on the subject 7 corresponding to the electroacoustic transformation part 3 with light where a minimal outer circumferential end interval Wmin between an outer circumferential end Ea of the corresponding area and an outer peripheral end Eb of the irradiation range is 5 mm or wider. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012135610(A) 申请公布日期 2012.07.19
申请号 JP20110258578 申请日期 2011.11.28
申请人 FUJIFILM CORP 发明人 IRISAWA SATORU;TSUJITA KAZUHIRO
分类号 A61B8/00 主分类号 A61B8/00
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