发明名称 |
ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE FILM AND PATTERN FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition which may suppress the elution of a photoacid generator to an immersion liquid and have an excellent immersion liquid follow-up property and further is excellent in roughness characteristics, and an actinic-ray-sensitive or radiation-sensitive film and a pattern forming method using the composition. <P>SOLUTION: An actinic-ray-sensitive or radiation-sensitive resin composition contains (A) a compound represented by the following formula (I) which generates an acid upon irradiation of an actinic ray or a radiation and (B) a resin which decomposes by an action of an acid to increase the solubility of the resin in an alkaline developer. (In the general formula (I), n represents an integer of 2 or more and X represents a hydrocarbon group.) <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012137686(A) |
申请公布日期 |
2012.07.19 |
申请号 |
JP20100291237 |
申请日期 |
2010.12.27 |
申请人 |
FUJIFILM CORP |
发明人 |
IIZUKA YUSUKE;SHIBUYA AKINORI;YAMAGUCHI SHUHEI;TANGO NAOHIRO |
分类号 |
G03F7/004;C08F220/10;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|