发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor structure and a manufacturing method thereof are provided. The method includes: providing a first semiconductor layer (200); providing a first dielectric material layer (210) on the first semiconductor layer, and defining openings in the first dielectric material layer; epitaxially growing a second semiconductor layer (220) on the first semiconductor layer through the openings, wherein the material of the second semiconductor layer is different from that of the first semiconductor layer; and in the second semiconductor layer, forming second dielectric material plugs (260) in the openings defined in the first dielectric material layer before and at the mid-position between adjacent such openings. The semiconductor structure has no or merely few epitaxial defects.</p>
申请公布号 WO2012094856(A1) 申请公布日期 2012.07.19
申请号 WO2011CN73266 申请日期 2011.04.25
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;LUO, ZHIJIONG;YIN, HAIZHOU;ZHU, HUILONG 发明人 LUO, ZHIJIONG;YIN, HAIZHOU;ZHU, HUILONG
分类号 H01L21/20 主分类号 H01L21/20
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