X-ray interferometer,申请号US19580778175-传众专利搜索

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发明名称	X-ray interferometer
摘要
申请公布号	US2999931(A)	申请公布日期	1961.09.12
申请号	US19580778175	申请日期	1958.12.04
申请人	PHILIPS ELECTRONICS, INC.	发明人	ZINGARO PLACIDO WILLIAM
分类号	G01N23/22;G03H5/00	主分类号	G01N23/22
代理机构		代理人
主权项
地址

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