发明名称
摘要 An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a trimming code by comparing the first comparing voltage with a second comparing voltage and increasing or decreasing a preset digital code in response to the comparing result; and a voltage level adjusting unit for adjusting a voltage level of the second comparing voltage by determining a maximum variation voltage and a minimum variation voltage based on the trimming code and a temperature control code.
申请公布号 JP4981396(B2) 申请公布日期 2012.07.18
申请号 JP20060269942 申请日期 2006.09.29
申请人 发明人
分类号 G01K7/01;G01K15/00;G11C11/406;H01L21/8242;H01L27/108 主分类号 G01K7/01
代理机构 代理人
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