发明名称 DIODE FOR SEMICONDUCTOR APPARATUS AND FABRICATION METHOD THEREOF
摘要 PURPOSE: A diode for a semiconductor device and a manufacturing method thereof are provided to prevent errors of record and read operations of a memory device by buffering an off leakage current in a PN junction diode. CONSTITUTION: A word line contact(203) is formed a semiconductor substrate(201). A word line(205) is formed on the word line contact. A conductive layer(207) is formed on the word line. A first silicon layer(209), a second silicon layer(211), and a third silicon layer(213) are successively formed on the conductive layer. The conductive layer is formed by using metal material. A thermal process is executed after forming the conductive layer, the first silicon layer, and the third silicon layer.
申请公布号 KR20120080353(A) 申请公布日期 2012.07.17
申请号 KR20110001754 申请日期 2011.01.07
申请人 SK HYNIX INC. 发明人 CHAE, SU JIN;KI, YOUNG JONG;SEO, HYE JIN
分类号 H01L29/861;H01L29/872 主分类号 H01L29/861
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