发明名称 Nonvolatile semiconductor memory device, method of fabricating the nonvolatile semiconductor memory device and process of writing data on the nonvolatile semiconductor memory device
摘要 A nonvolatile semiconductor memory device includes a semiconductor substrate, a plurality of first element isolation insulating films formed on a surface of the semiconductor substrate corresponding to a first cell array region into a band shape, a plurality of second element isolation insulating films formed on a surface of the semiconductor substrate corresponding to a second cell array region into a band shape. Each first element isolation insulating film has a level from a surface of the semiconductor substrate, the first charge storage layer has a level from the surface of the semiconductor substrate, and each second element isolation insulating film has a level from the surface of the semiconductor substrate, the level of each first element isolation insulating film being lower than the level of the first charge storage layer and higher than the level of each second element isolation insulating film.
申请公布号 US8222106(B2) 申请公布日期 2012.07.17
申请号 US201113308629 申请日期 2011.12.01
申请人 HAZAMA HIROAKI;KABUSHIKI KAISHA TOSHIBA 发明人 HAZAMA HIROAKI
分类号 H01L21/336;H01L21/331;H01L21/76 主分类号 H01L21/336
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