发明名称 System for analysing the frequency of resonating devices
摘要 The general field of the invention is that of resonating or vibrating devices. One of the tricky points with this type of device is that of correctly measuring the vibration frequency in a disturbed environment. The analysis system according to the invention is based on the use of the Hilbert transform of a function U representative of the position A of the vibrations of the device. More precisely, in its basic version, the analysis system comprises means making it possible to realize the second derivative of the function U denoted U(2), the Hilbert transform of the function U denoted V, the second derivative of this transform denoted V(2) as well as a function equal to - U · U ( 2 ) + V · V ( 2 ) U 2 + V 2 , this latter function being mathematically equal to the function ω 1 2 - &rgr; 1 ( 2 ) &rgr; 1 with ω1 the instantaneous angular frequency of U, &rgr;1 the instantaneous amplitude of U, &rgr;1(2) the second derivative of said instantaneous amplitude and being representative of the square of the resonant angular frequency &OHgr; of the vibrating device. Several variants of this initial device are proposed.
申请公布号 US8220331(B2) 申请公布日期 2012.07.17
申请号 US20080126820 申请日期 2008.05.23
申请人 LEGOLL SEBASTIEN;GUILLARD PATRICE;THALES 发明人 LEGOLL SEBASTIEN;GUILLARD PATRICE
分类号 G01H11/06 主分类号 G01H11/06
代理机构 代理人
主权项
地址