发明名称 |
Gate delay measurement circuit and method of determining a delay of a logic gate |
摘要 |
A system and method to measure a delay of an individual logic gate in an unmodified form on a chip using a digitally reconfigurable ring oscillator (RO) that is on the chip is provided. A system of linear equations is established for different configuration settings of the ring oscillator and solved to determine a delay of an individual gate. |
申请公布号 |
US8224604(B1) |
申请公布日期 |
2012.07.17 |
申请号 |
US20090539372 |
申请日期 |
2009.08.11 |
申请人 |
AMRUTUR BHARADWAJ;DAS BISHNU PRASAD;INDIAN INSTITUTE OF SCIENCE |
发明人 |
AMRUTUR BHARADWAJ;DAS BISHNU PRASAD |
分类号 |
G01R29/00;G06F11/26 |
主分类号 |
G01R29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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