PURPOSE: A substrate test method and apparatus are provided to shorten inspection time by controlling a lot inspection in order to match with tact time of a sampling inspection or a process. CONSTITUTION: An indentation impression crack inspection table(200) inspects an indentation impression inspection and a crack inspection at the same time. The indentation impression inspection inspects the state of a conduction ball attached to a substrate. The crack inspection inspects cracks of a portion of the substrate in which a tap is attached. A tap align inspection table(300) is included in one housing(100). The tap align inspection table completely inspects tap align. An indentation impression inspection camera and a crack inspection camera are installed at the align inspection table.
