发明名称 |
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique for reducing consumption of a material gas and a reaction gas. <P>SOLUTION: A substrate processing method performs the following steps alternately several times: a film generation step S1 of forming a silicon-containing film with respect to a substrate in a processing chamber while supplying and exhausting a hydrogen-containing gas and a silicon-containing gas to and from the substrate and absorbing heat from the substrate; and a temperature re-raising step S2 of stopping supply of the hydrogen-containing gas and the silicon-containing gas and raising the temperature of the substrate. This enables suppression of a decrease in a growth rate of the silicon-containing film, thereby reducing the consumption of a material gas and a reaction gas. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012134332(A) |
申请公布日期 |
2012.07.12 |
申请号 |
JP20100285327 |
申请日期 |
2010.12.22 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
INOKUCHI YASUHIRO;KUNII YASUO;MAEDA TAKAHIRO;SUZAKI KENICHI |
分类号 |
H01L21/205;C23C16/24 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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